Scanning electron microscope: JEOL JSM-6010LV Plus

At Medace, we provide access to advanced equipment to support your research and innovation. One of our premier instruments is the JEOL JSM-6010LV Plus Scanning Electron Microscope (SEM), designed to deliver high-resolution imaging and detailed analysis for your scientific needs.

Why choose the JEOL JSM-6010LV Plus SEM?

The JEOL JSM-6010LV Plus SEM is engineered for precision and versatility, offering unmatched capabilities in imaging and analysis. This sophisticated microscope ensures your research outcomes are both accurate and consistent, making it an essential tool for a variety of applications.

Comprehensive imaging and analysis services

To support your research, we offer a wide range of imaging and analysis services, including:

• Nanometer resolution: achieve ultra-high resolution imaging down to the nanometer scale, allowing for detailed visualization of your samples.
• Surface structure and material composition: obtain comprehensive information on the surface structure and material composition of your samples, aiding in thorough analysis and research.
• Versatile sample handling: benefit from the ability to handle a wide variety of sample types, enhancing the flexibility and scope of your research.
• Accurate detection and measurement: ensure precise detection and measurement of particles, crucial for high-quality data and analysis.
• Customized imaging conditions: utilize variable voltage and vacuum settings to tailor imaging conditions to your specific research needs, ensuring optimal results.